This work investigates the effect of interface traps on the impedance spectra of dopant-free silicon solar cells. The studied device consists of a crystalline silicon absorber with an a-Si:H/MoOx/ITO stack as the front passivating hole-collecting contact and an a-Si:H/LiF/Al stack as the rear passivating electron-collecting contact. Experimental measurements, including illuminated current–voltage (I–V) characteristics and impedance spectroscopy, were performed on the fabricated devices and after a soft annealing treatment. The annealed cells exhibit an increased open-circuit voltage and a larger Nyquist plot radius. To interpret these results, a numerical model was developed in a TCAD environment. Simulations reveal that traps located at the p/i interface (MoOx/i-a-Si:H) significantly affect the impedance spectra, with higher trap concentrations leading to smaller Nyquist plot circumferences. The numerical impedance curves were aligned to the experimental data, enabling extraction of the interfacial traps concentration. The results highlight the sensitivity of impedance spectroscopy to interfacial quality and confirm that the performance improvement after soft annealing is primarily due to reduced defect density at the MoOx/i-a-Si:H interface.
Matacena et al. (Thu,) studied this question.