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Reference-free x-ray fluorescence analysis with a micrometer-sized incident beam | Synapse

April 5, 2024Open Access

Reference-free x-ray fluorescence analysis with a micrometer-sized incident beam

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Abstract

Spatially resolved x-ray fluorescence (XRF) based analysis employing incident beam sizes in the low micrometer range (

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Cite This Study

Hönicke et al. (Fri,) studied this question.

synapsesocial.com/papers/68e70454b6db64358767debe https://doi.org/https://doi.org/10.1088/1361-6528/ad3aff

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