ionizing particle radiation detection and damage compensation methods for CMOS active pixel sensors

Key Points

• Damage compensation methods improve the performance of CMOS active pixel sensors under ionizing radiation exposure, enhancing their reliability.
• The study highlights the importance of effective radiation detection techniques in preserving sensor functionality.
• Devices using CMOS technology can better withstand ionizing radiation, with key improvements noted in sensitivity and signal integrity.
• Effective strategies are crucial for future advancements in radiation-sensitive imaging systems.