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In microscopy, proper modeling of the image formation has a substantial effect on the precision and accuracy in localization experiments and facilitates the correction of aberrations in adaptive optics experiments. The observed images are subject to polarization effects, refractive index variations, and system specific constraints. Previously reported techniques have addressed these challenges by using complicated calibration samples, computationally heavy numerical algorithms, and various mathematical simplifications. In this work, we present a phase retrieval approach based on an analytical derivation of the vectorial diffraction model. Our method produces an accurate estimate of the system's phase information, without any prior knowledge about the aberrations, in under a minute.
Ferdman et al. (Mon,) studied this question.