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Abstract The intensity distribution of the N K‐emission band of hexagonal boron nitride samples with partially oriented crystallites is found to be strongly dependent upon the take‐off angle of the emitted radiation. The obserbed emission bands can be separated unambiguously into a σ‐ and a ‐subband. On the basis of the directional characteristic of radiating dipoles within the layers (σ‐bondings) and perpendicular to the layers (π‐bonding) the angular dependence of the intensity of the subbands is quantitatively explained. In addition, the degree of orientation of the crystallites in the sample can be determined. The intensity distributions of the emission bands to be expected for single crystals and for samples without any texture are determined; in the latter case the results are found to be in good agreement with experiment.
Tegeler et al. (Thu,) studied this question.