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The lifetime of the zero-voltage state of a current-biased Josephson junction in the thermal limit has been measured in the presence of a weak microwave perturbation. When the microwave frequency is close to the plasma frequency of the junction, the junction is "resonantly activated" out of the zero-voltage state, with a corresponding reduction in. The results are well explained by numerical simulations.
Devoret et al. (Mon,) studied this question.
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