ABSTRACT Defect sinks play a crucial role in reducing radiation‐induced damage accumulation, but their effectiveness varies. This study directly compares the efficacy of grain boundaries and pores (free surfaces) in gadolinium titanate (Gd 2 Ti 2 O 7 ) using in situ ion irradiation transmission electron microscopy (TEM). A unique sample configuration is developed, where each of the three distinct regions, each containing only one primary sink of interest, is in the same TEM lamella for simultaneous irradiation. Regular assessments of crystallinity in each region via nanobeam electron diffraction show that, at both room temperature and 600°C, free surface (pore) defect sinks are more effective than grain boundaries in capturing radiation‐induced defects and delaying the onset of amorphization. These findings have significant implications for further microstructural engineering and the design of radiation‐resistant microstructures.
Madden et al. (Wed,) studied this question.