ABSTRACT In this work, we investigate the feasibility of using Energy‐Dispersive Inelastic X‐ray Scattering (EDIXS) to extract structural information analogous to that obtained from Extended X‐ray Absorption Fine Structure (EXAFS) spectroscopy. A set of four well‐characterized vanadium reference samples (metallic V and the oxides V 2 O 3 , VO 2 , and V 2 O 5 ) was selected to cover a wide range of oxidation states and local coordination environments. EDIXS spectra were smoothed using a high‐frequency band‐pass filter based on the instrumental response function, and the main emission line was fitted and subtracted to recover residual oscillations. These oscillations were treated as a surrogate χ ( k ) function and analyzed using Fast Fourier Transform (FFT) procedures identical to those applied in standard EXAFS analysis. The resulting FFT magnitudes from EDIXS were compared with those obtained from independently measured EXAFS spectra. In most cases, the apparent first‐shell distance R 1 extracted from EDIXS agreed with the corresponding EXAFS value within statistical uncertainty, demonstrating that the EDIXS‐derived residuals contain genuine structural information. A quantitative statistical comparison was performed using a normal‐distribution z ‐test with α = 0.05, confirming equivalence in three out of four cases. These results show that, under appropriate filtering and analysis conditions, EDIXS spectroscopy can provide semi‐quantitative structural information and may serve as a complementary technique to EXAFS, particularly in systems where conventional absorption measurements are difficult or impossible. The approach presented here opens new possibilities for exploiting inelastic scattering spectra in structural and chemical analysis.
Sánchez et al. (Thu,) studied this question.