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Finding 2D and thin‐film layered materials have become essential to develop not only in scientific‐related fields, but also in a wide industry, which is constantly feeding from this progress. For electronic devices, thin‐film materials are supposed to be a step forward to overcome Moore's law. In many other technologic areas, the development of tools based on flakes of materials has found new physics, becoming a rising field. Although, destructive techniques are commonly used to characterize the thickness of these materials. Herein, a list of materials is presented, whose thicknesses are characterized by their apparent colors in several substrates, a harmless, fast, and reliable technique that has been already used to determine the number of layers in several works. This list is also enlarged with other materials and substrates.
Puebla et al. (Wed,) studied this question.
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