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We have measured the thermal behaviour of the resistance of three GaAs wires (thickness : 0.32 μm, widths : 0.8 ; 2.4 and 5.4 μm; lengths : 400, 400 and 200 μm) produced by lithographic techniques. We observe a cross-over between a one-dimensional regime, at low temperatures, and a two-dimensional regime, above 1 K. In both limits, the results are similar to those observed separately on 1d and 2d samples in other systems.
Laviron et al. (Sat,) studied this question.
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