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In the midterm future, the photovoltaic industry is expected to be dominated by two‐terminal (2T) perovskite–silicon (pero–Si) tandem solar cells, which have high energy conversion efficiency and require characterization for large‐scale production. Electroluminescence (EL) imaging is one of the most prevalent and nondestructive techniques for defect detection, recognition, and characterization in Si‐solar cells in mass production. This work presents an EL setup that enables fast, simultaneous, and separate luminescence capture from the two subcells of pero–Si tandem devices. To demonstrate the setup, several encapsulated 2T pero–Si tandem samples are investigated. First, the effect that resistive coupling between the two subcells has on defect appearance in EL images is recorded. Therefore, EL image under different operational conditions is recorded. A strong dependence of defect signatures on current injection is observed, that is explained partly by resistive coupling but partly as well by injection‐dependent changes of the prevalent defects in the cells. An investigation of preconditioning under dark forward operation reveals significant local decrease of EL intensity going along with rapid reversible or irreversible and severe degradation close to the edges of the samples. This degradation takes place under forward bias during a period of ≈1 h.
Djeukeu et al. (Tue,) studied this question.