An open-source data collection platform for TriBeam microscopes that simplifies the process of building a collection experiment, metadata logging, and automated serial sectioning is presented. Microscope conventions and sample geometries for successful experiments are described, as well as a graphical user interface for building the steps required for a given experiment. Example workflows for data collection with and without electron backscatter diffraction information are included that will quickly familiarize a researcher with the required steps for serial sectioning. Guidance for choosing femtosecond laser and plasma focused ion beam parameters is also detailed, with images of typical surface features. An overview of new capabilities that will be developed in future, including API support, FIB-SEM serial sectioning, and automated process controls, will also be reviewed.
Polonsky et al. (Fri,) studied this question.