Scanning Near-Field Optical Microscopy on Hyperuniform Disordered photonic materials

Key Points

• Level repulsion between delocalized states is observed in hyperuniform disordered photonic structures—this finding is novel.
• The detection was achieved using Scanning Near-field Optical Microscopy, a specific imaging technique for optical properties.
• Hyperuniform disordered photonic materials enable custom control of Anderson localization and diffusive transport phenomena.
• The results imply potential advancements in photonic materials and their applications in optical technologies.