Minimizing Unintended Background Signals Arising from Conventional Mounting Techniques in Sensitive Magnetometry

Two-dimensional (2D) van der Waals materials have attracted considerable interest for nanoscale spintronic devices such as spin valves, spin-filter magnetic tunnel junctions, and magnetic field sensors. Understanding the intrinsic magnetism in these systems is essential, particularly as measurements often require ultra-sensitive magnetometry near detection limits, where artefacts and magnetic contamination can significantly affect results. Consequently, the reliability of magnetometric detection of ferromagnetism in such materials has been questioned. Here, we systematically investigate magnetic contamination introduced when Teflon or K-tape is used during sample placement for measurements and handling propose to mitigate or eliminate these artifacts. We present the temperature- and magnetic field-dependent magnetization data of 1T-TiSe₂ obtained following these procedures, which is diamagnetic in the temperature range of 5−300 K.