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Abstract Raman spectroscopy was used to distinguish the individual members of the two feldspar subgroups. All feldspars were found to exhibit a characteristic, intense line between 500 and 515 cm −1 which is attributed to a mixed SiOSi (or SiOAl) bending/stretching mode. However, discrimination between the related members within each subgroup relies on the change in frequencies and band widths which occur in the external lattice modes and in the SiO stretching region. Spectra were recorded from single crystals and powders and demonstrate that the laser Raman microprobe can provide non‐destructive and rapid identification of feldspars on the microscopic scale.
Terrence P. Mernagh (Thu,) studied this question.