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We present experimental techniques to analyze the electroluminescence (EL) of polymer light-emitting diodes following the removal of an applied voltage pulse. We explain the fast modulation of the EL intensity at turn-off in terms of the sudden reduction of the Langevin recombination rate, and extract the time evolution the device’s internal electric field at the recombination zone during the application of a voltage pulse. The results are compared to, and found to be consistent with, those of simple numerical modeling. The subsequent long-lived EL tail is analyzed to give the time evolution of the carrier distributions at the recombination zone once the voltage pulse has been removed.
Pinner et al. (Mon,) studied this question.
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