To address the voltage regulation problem of the DC-DC buck converter under multi-source disturbances, this paper proposes a composite anti-disturbance control strategy integrating a Chebyshev-based self-evolving fuzzy neural network (SECFNN) and an arctangent super-twisting sliding mode control (ASTSMC). First, to construct the composite anti-disturbance framework, a load algebraic reconstruction compensator (LARC) is utilized to analytically estimate real-time load dynamics, providing active feedforward compensation for extreme load steps. Second, targeting the unmodeled nonlinearities and parameter uncertainties, the SECFNN is deeply integrated into the control loop. It employs a bidirectional structural learning mechanism—dynamically growing and pruning fuzzy rules—to achieve high-precision adaptive approximation and intelligent compensation. Furthermore, serving as the robust inner-loop core of this composite strategy, the ASTSMC is introduced. By replacing the traditional discontinuous sign function with a continuous arctangent operator, it effectively mitigates sliding mode chattering while ensuring the rapid finite-time convergence of the current tracking error. Ultimately, by synergistically fusing feedforward disturbance rejection (LARC), intelligent nonlinear approximation (SECFNN), and robust tracking (ASTSMC), the proposed strategy significantly reduces transient voltage drops and achieves smoother steady-state performance. Comparative simulation experiments demonstrate the superiority of the proposed method, achieving a rapid startup settling time of 6.5 ms, limiting the maximum transient voltage drop to 15 mV, and completing dynamic reference tracking in 1.2 ms. Furthermore, hardware experimental results confirm its practical engineering feasibility, demonstrating a fast startup of 8.3 ms with zero overshoot, effectively mitigating transient voltage drops during load step changes, and completing dynamic tracking in just 2.2 ms, which verifies its reliable dynamic agility and strong robustness under various test conditions.
Du et al. (Mon,) studied this question.