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Two algorithms are presented: one, DALG-II, computes a test to detect a failure in acyclic logic circuits; the other, TEST-DETECT, ascertains all failures detected by a given test. Both are based upon the utilization of a ``calculus of D-cubes'' that provides the means for effectively performing the necessary computations for very large logic circuits. Strategies for combining the two algorithms into an efficient diagnostic test generation procedure are given. APL specifications of the algorithms are given in an Appendix.
Roth et al. (Sun,) studied this question.