Fabric defect detection by Fourier analysis

Many fabric defects are very small and undistinguishable, which are very difficult to detect by only monitoring the intensity change. Faultless fabric is a repetitive and regular global texture and Fourier transform can be applied to monitor the spatial frequency spectrum of a fabric. When a defect occurs in fabric, its regular structure is changed so that the corresponding intensity at some specific positions of the frequency spectrum would change. However, the three-dimensional frequency spectrum is very difficult to analyze. In this paper, a simulated fabric model is used to understand the relationship between the fabric structure in the image space and in the frequency space. Based on the three-dimensional frequency spectrum, two significant spectrum diagrams are defined and used for analyzing the fabric defect. These two diagrams are called the central spatial frequency spectrums. The defects are broadly classified into four classes: (1) double yarn; (2) missing yarn; (3) webs or broken fabric; and (4) yarn densities variation. After evaluating these four classes of defects using some simulated models and real samples, seven characteristic parameters for central spatial frequency spectrum are extracted for defect classification.