The article presents a radiation reading imager column readout circuit modified to reduce the recharge currents of parasitic capacitances and non-uniformity along the vertical axis. To reduce the noise level at the output of the column processing circuit, low-noise bias voltage generation circuits for the readout circuit were proposed, providing the generation of a specified current value through background compensation and active elements. The described circuits also reduce the effect of flicker noise and compensate for single pixel non-ideality. The resulting noise RMS value at the output is no more than 1,55 LSB with a 14-bit output code.
Egor Belousov (Wed,) studied this question.