Demonstrates RF termination effectiveness in high-speed photonic platforms, indicating compact integration benefits.
In this paper, we demonstrate a compact broadband on-chip radio-frequency (RF) termination based on pure titanium thin-film resistors integrated into coplanar waveguide (CPW) structures. The terminated transmission lines exhibit good impedance matching, with simulated reflection coefficients below −20 dB over 100 GHz bandwidth and experimentally measured reflections below −10 dB up to 65 GHz. Additional measurements evaluate the stability and power-handling behavior of the Ti resistors. The results show that thin-film titanium can operate as an effective on-chip RF termination in integrated CPW structures, maintaining stable RF performance over repeated measurements. Such terminations are relevant for high-speed photonic platforms where compact integration and reduced packaging complexity are desirable, including dense modulator architectures.
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Talebi et al. (2026) studied this question.
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