Synapse
⌘+K
Synapse
PulseExploreClubsResearchersJournals
Instagram
HomeClubsExplore
November 1, 1968Bell System Technical Journal

Influence of Bulk and Surface Properties on Image Sensing Silicon Diode Arrays

View Full Paper
Ask AI
Bookmark
Share

Authors

TBT.M. BuckMurray State UniversityHCH. C. CaseyKansas State UniversityJDJ. V. DaltonMaxLinear (United States)

Discussion

Loading...

Member takes

Implication

Key Points

Key points are not available for this paper at this time.

Cite This Study

Buck et al. (1968) studied this question.

synapsesocial.com/papers/6a1a4e4c97d4ffb2999bb5a6https://doi.org/10.1002/j.1538-7305.1968.tb01092.x
View Full Paper
Ask AI
Bookmark
Share

Also Consider

Synapse has enriched 4 closely related papers on similar clinical questions. Consider them for comparative context:

  1. 1A Camera Tube with a Silicon Diode Array Target1967 · 60 citations
  2. 2Metal Precipitates in Silicon p-n Junctions1960 · 271 citations
  3. 3Measurement of Diffusion Lengths in Direct-Gap Semiconductors by Electron-Beam Excitation1967 · 254 citations
  4. 4Effects of Certain Chemical Treatments and Ambient Atmospheres on Surface Properties of Silicon1958 · 107 citations