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PURPOSE: To accurately measure the beam filter profiles from a variety of CT scanner models and to provide reference data for Monte Carlo simulations of CT scanners. METHODS: This study proposed a new method to measure CT beam filter profiles using a linear-array x-ray detector (X-Scan 0.8f3-512; Detection Technology Inc., Espoo, Finland) under gantry rotation mode. A robust geometrical calibration approach was developed to determine key geometrical parameters by considering the x-ray focal spot location relative to the linear-array detector and the gantry's angular increment at each acquisition point. CT beam intensity profiles were synthesized from continuously measured data during a 10° gantry rotation range with calibrated detector response and system geometry information. Relative transmission profiles of nineteen sets of beam filters were then derived for nine different CT scanner models from three different manufacturers. Equivalent aluminum thickness profiles of these beam filters were determined by analytical calculation using the Spektr Matlab software package to match the measured transmission profiles. Three experiments were performed to validate the accuracy of the geometrical calibration, detector response modeling, and the derived equivalent aluminum thickness profiles. RESULTS: The beam intensity profiles measured from gantry rotation mode showed very good agreement with those measured with gantry stationary mode, with a maximal difference of 3%. The equivalent aluminum thickness determined by this proposed method agreed well with what was measured by an ion chamber, with a mean difference of 0.4%. The determined HVL profiles matched well with data from a previous study (max difference of 4.7%). CONCLUSIONS: An accurate and robust method to directly measure profiles from a broad list of beam filters and CT scanner models was developed, implemented, and validated. Useful reference data was provided for future research on CT system modeling.
Yang et al. (Sun,) studied this question.