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This paper proposes a column-parallel two-step single-slope analog-to-digital converter (SS ADC) for high-frame-rate CMOS image sensors. The proposed two-step SS ADC circuit does not utilize an analog memory capacitor to store the value of the first ramp step. Instead, to handle problems such as the slope errors of the second ramp and the stored charge error from charge feed-through, it utilizes a very simple digital column circuit consisting of a coarse counter (coarse step counter) and a 4-to-16 decoder. The second ramp (fine ramp) slope has only one slope generator, regardless of the results of the first ramp decisions, to eliminate the slope mismatch between fine ramp slopes. A prototype sensor comprising 640 × 480 pixels was fabricated with a 0.13- μm CMOS process. The results of experiments conducted indicate that the proposed ADC can achieve a conversion time of 6.4 μs at a main clock frequency of 62.5 MHz, which is 10.2 times faster than the conventional SS ADC. The maximum frame rate of the proposed VGA CMOS Image Sensor (CIS) is 320 frames per second (fps). Further, the proposed circuit employs redundancy error correction logic to calibrate the error between the coarse and fine steps. The total power consumption is 72 mW from supply voltages of 2.8 V (analog) and 1.5 V (digital). The figure of merit (FoM) of the proposed VGA CMOS image sensor is 2.01 e - nJ.
Lee et al. (Fri,) studied this question.