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How can the electric noise in the vicinity of a metallic body be measured and understood? Trapped ions, known as unique tools for metrology and quantum information processing, also constitute very sensitive probes of this electric noise for distances from micrometers to millimeters. This paper presents various models for the origin of the electric noise, provides a critical review of the experimental findings, and summarizes the important questions that are still open in this active research area.
Brownnutt et al. (Fri,) studied this question.