Trapped Electromagnetic Modes and Scaling in the Transmittance of Perforated Metal Films

We describe measurements and simulations of the enhanced transmittance by subwavelength hole arrays in silver films. The array period and hole size are systematically varied to give peak transmittances at wavelengths spanning a factor of 14. The spectra coincide when scaled using the array geometry and substrate refractive index alone, thus showing no significant dependence on the dielectric function of the metal. We argue that the spectra can be explained by interference of diffractive and resonant scattering. The resonant contribution comes from electromagnetic modes trapped in the film vicinity.