Electron Diffraction Evidence for the Existence of Microstress in Evaporated Metal Films

The line broadening in electron diffraction powder patterns from evaporated nickel films has been investigated. The pure diffraction broadening was found to vary with the Bragg angle in agreement with a microstress theory of broadening rather than with a particle size mechanism. The Fourier transform of the pure diffraction broadening has been determined and also found to be in agreement with a microstress mechanism.