Functional Testing of Semiconductor Random Access Memories

article Free Access Share on Functional Testing of Semiconductor Random Access Memories Authors: Magdy S. Abadir Department of Electrical Engineering, University of Southern California, Los Angeles, California Department of Electrical Engineering, University of Southern California, Los Angeles, CaliforniaView Profile , Hassan K. Reghbati Computing Science Department, Simon Fraser University, Burnaby, British Columbia, Canada V5A 1S6 Computing Science Department, Simon Fraser University, Burnaby, British Columbia, Canada V5A 1S6View Profile Authors Info & Claims ACM Computing SurveysVolume 15Issue 3Sept. 1983 pp 175–198https://doi.org/10.1145/356914.356916Published:01 September 1983Publication History 158citation1,326DownloadsMetricsTotal Citations158Total Downloads1,326Last 12 Months165Last 6 weeks36 Get Citation AlertsNew Citation Alert added!This alert has been successfully added and will be sent to:You will be notified whenever a record that you have chosen has been cited.To manage your alert preferences, click on the button below.Manage my AlertsNew Citation Alert!Please log in to your account Save to BinderSave to BinderCreate a New BinderNameCancelCreateExport CitationPublisher SiteeReaderPDF