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The results of Rietveld refinements using synchrotron X-ray powder diffraction data collected in transmission mode with a new flat imaging-plate (IP) technique agree with those obtained from other techniques, m-ZrO2 was chosen as test compound because it was the standard selected by the Commission on Powder Diffraction of the International Union of Crystallography for a round robin of Rietveld refinement using data obtained by different techniques and from different laboratories Hill & Cranswick (1994). J. Appl. Cryst. 27, 802–844. For comparison, new data were also collected using a gas-filled position-sensitive detector. Powder diffraction using a flat IP detector requires a modification to the geometric term of the Lorentz factor and the zero-shift correction. Other factors that were accurately taken into account are the polarization of the synchrotron beam, the angle-dependent variations induced by the use of a flat detector and the absorption.
Gualtieri et al. (Sun,) studied this question.