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Effects of surface roughness on electrical properties of a thin insulating film capacitor with one smooth electrode plate and one rough electrode plate are investigated. The electrode plate roughness is described in terms of self-affine fractal scaling through the roughness exponent, the root-mean square (rms) roughness amplitude w, and the correlation length. The electric field, capacitance, and leakage current show similar qualitative changes with the roughness parameters: they all increase as w increases, and also increase as either or decreases.
Zhao et al. (Wed,) studied this question.