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X-ray computed tomography using synchrotron radiation (SR) as X-ray source potentially provides CT images of improved quality, since SR produces tunable, monochromatized and collimated X-ray beams of high flux density. We can obtain CT images of small samples rapidly with better spatial resolution and contrast; we can also obtain the spatial distribution of a specific element using the absorption edge. In this paper, a method for improving the spatial resolution of such a system is presented, involving the magnification of projection images using asymmetric diffraction. First, the modulation transfer function (MTF) of projection images of an X-ray test chart is measured in order to evaluate the spatial resolution. Next, using this method, we show CT images of several industrial materials with spatial resolution of 15∼30 µm and demonstrate the usefulness of SR-CT with a high spatial resolution.
Sakamoto et al. (1988) studied this question.