Design and validation of a power supply noise reduction technique

For the high-performance microprocessors with high-bandwidth I/O, the power supply noise needs to be controlled to ensure reliable high speed bus operation. This is generally done with high-quality package capacitors. These capacitors are generally lower equivalent series inductance (ESL) and lower equivalent series resistor (ESR). In this paper, we will present two implementations of an approach of using on-die resistors in series with the package capacitance to dampen the high-frequency noise. We will show by validation on the 90-nm technology that this technique is capable of reducing the noise by nearly 80% without adversely affecting the timings. The results of several validation experiments, including the measurement of noise and impedance of the I/O power delivery, and the post-layout simulation will also be presented.