Characterization of NiO by XPS

We report x-ray photoemission spectra (XPS) of nickelous oxide (NiO). XPS spectra were measured with the Physical Electronics Model 5400 x-ray photoelectron spectrometer using unmonochromatized Mg Kα x rays at two pass energy settings corresponding to analyzer energy resolutions of 1.34 and 0.54 eV. We present the survey spectrum (binding energy range of 0–1100 eV) measured at an analyzer energy resolution of 1.34 eV. Multiplexes of the C, O, and Ni photoemission lines, valence band region, as well as the Ni LVV Auger line were measured at an analyzer energy resolution of 0.54 eV. The research grade high purity NiO sample was obtained commercially from Atomergic Chemetals Corporation.