Key points are not available for this paper at this time.
The design of a computer system which directly controls tunnel barrier width in a scanning tunneling microscope (STM) is described. This capability allows STM scans to be performed at a speed which is automatically determined by the roughness of the surface under study. The computer system is inexpensive and designed with readily available components for the VME bus.
Piner et al. (Sun,) studied this question.