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Abstract A study of signal‐to‐noise ( S / N ) was made in a Kratos ES300 XPS system on a variety of materials using both monochromatic and conventional X‐ray sources covering a wide range of count rates. Equations relating S / N to total counts ( S + B ), background ( B ), and the signal‐to‐background ( S / B ) ratio were derived and tested for data obtained in a system limited by noise from counting statistics.
Koenig et al. (Tue,) studied this question.