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For 15 years, the rapid degradation of luminance over time has rendered blue phosphorescent light emitting diodes (PHOLEDs) too short-lived for many practical applications. To date, studies have concentrated on the degradation of the emitting materials, yet not the many other parts of these devices. The authors develop a method to measure charge and exciton leakage directly over time, and find that these effects are n0{0ex}o0{0ex}t responsible for PHOLED degradation---an important revelation that shifts our attention toward the actual sources of failure.
Coburn et al. (Mon,) studied this question.