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The figures of merit (FOM) are tools that allow measuring the performance or effectiveness of procedures, systems, or devices. To evaluate transparent conductive films (TCF), the most widely used FOMs are Fraser which is to give more value to the transmittance against the sheet resistance. We call this new expression FOM Haacke High Resolution. We show that FOM Haacke High Resolution can be used without loss of resolution at any intervals of transmittance and sheet resistance. Thus, it could be an excellent tool for intergroup comparisons of TCFs. Keywords: Transparent conductive films, Figures of merit, ITO, AZO, FOM Haacke, FOM Fraser & Cook
Cisneros-Contreras et al. (Wed,) studied this question.