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Ensembles of nitrogen-vacancy (N-V) centers in diamond show promise as versatile electric field sensors, but are limited by noise from an inhomogeneous internal charge environment. Here researchers develop a scheme for optically enhanced electrometry that improves N-V sensitivity to external electric fields, especially at low temperatures. They also implement a complementary method for experimentally extracting the color center's excited-state electric field susceptibilities, and they provide a simple scaling theory for optimizing the density of N-V defects in electrometry applications.
Block et al. (Fri,) studied this question.