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The combination of chirality and semiconducting properties has enabled chiral metal-halide semiconductors (MHS) to be promising candidates for spin- and polarization-resolved optoelectronic devices. Although several chiral MHS with rich chemical and structural diversity have been reported lately, the macroscopic origin of chiroptical activity remains elusive. Here, combining spectroscopic measurements and Mueller matrix analysis, we discover that the previously reported "apparent" anisotropy factor measured from circular dichroism (CD) in chiral MHS thin films is not an intrinsic chiroptical property, but rather, arising from an interference between the film's linear birefringence (LB) and linear dichroism (LD). We verify the presence of LB and LD effects in both one-dimensional and zero-dimensional chiral MHS thin films. We establish spectroscopic methods to decouple the genuine CD from other spurious contributions, which allows a quantitative comparison of the intrinsic chiroptical activity across different chiral MHS. The relationship between the structure and the genuine chiroptical activity is then uncovered, which is well described by the chirality-induced spin-orbit coupling in the chiral structures. Our study unveils the macroscopic origin of chiroptical activity of chiral MHS and provides design principles for obtaining high anisotropic factors for future chiral optoelectronic applications.
Zhang et al. (Fri,) studied this question.