Solid Electrolyte Interphase Layer Formation on the Si-Based Electrodes with and without Binder Studied by XPS and ToF-SIMS Analysis

The formation and evolution of the solid electrolyte interphase (SEI) layer as a function of electrolyte and electrolyte additives has been extensively studied on simple and model pure Si thin film or Si nanowire electrodes inversely to complex composite Si-based electrodes with binders and/or conductive carbon. It has been recently demonstrated that a binder-free Si@C-network electrode had superior electrochemical properties to the Si electrode with a xanthan gum binder (Si-XG-AB), which can be principally related to a reductive decomposition of electrolytes and formation of an SEI layer. Thus, here, the Si@C-network and Si-XG-AB electrodes have been used to elucidate the mechanism of SEI formation and evolution on Si-based electrodes with and without binder induced by lithiation and delithiation applying surface analytical techniques. The X-ray photoelectron spectroscopy and time-of-flight ion mass spectrometry results demonstrate that the SEI layer formed on the surface of the Si-XG-AB electrode during the discharge partially decomposes during the subsequent charging process, which results in a less stable SEI layer. Contrarily, on the surface of the Si@C-network electrode, the SEI shows less significant decomposition during the cycle, demonstrating its stability. For the Si@C-network electrode, initially, the inorganic and organic species are formed on the surface of the carbon shell and the silicon surface, respectively. These two parts of species in the SEI layer gradually grow and then fuse when the electrode is fully discharged. The behavior of the SEI layer on both electrodes corroborates with the electrochemical results.