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Abstract Vacuum‐evaporated metal halides (MHs) scintillator thick films have received much attention in the X‐ray imaging field due to their excellent light yield and uniform large‐area preparation. However, the inevitable heteromorphic homologs in MHs (e.g., Copper‐based MHs (Cu‐MHs): CsCu 2 X 3 ∖Cs 3 Cu 2 X 5 ) and change of film structural backbone will result in spectral hybridization (phase purity), and the film eventually detaches (lattice mismatches). Herein, a single‐source vacuum evaporation method to prepare a thick film (≈10 µm) of Cu‐MHs (as an example) scintillators is realized: 1) Presynthesis of pure phase materials by solution method with a protective agent to ensure phase purity without precise control of component ratios in evaporation process; 2) One‐shot formation of film structural backbone avoids stress accumulation and utilize the longitudinal growth characteristics of crystalline films to obtain crystal orientations with better optical outputs. Finally, the films obtained have a light yield comparable to a partially single‐crystal (53 983 photons MeV −1 ) and an imaging resolution (14.1 lp mm −1 ) comparable to the partial template method. The detection system based on the prepared Cu‐MHs scintillator thick films exhibits good response speed and linearity in response to different X‐ray radiation intensities and exposure times. The method will further drive the application of MHs is believed.
Peng et al. (Fri,) studied this question.