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A novel noniterative microwave method is proposed for relative permittivity ᵣ extraction of solid samples using thickness-independent reference-plane-invariant (RPI) expressions. The main idea behind our method is the usage of the frequency-domain first reflection coefficient (in addition to full scattering parameters) obtained from gating the first peak inside the sample using a proper time-gating procedure. To validate and examine its accuracy, measurements of ᵣ have been performed over 0. 01 – 26. 5 GHz for three different dielectric materials acrylonitrile butadiene styrene (ABS), polyethylene terephthalate glycol (PETG), and the polylactic acid (PLA) with different thicknesses positioned into a 50- coaxial airline. The effects of a number of frequency points, the value of IF bandwidth (BW), the window type, and the span of the window on ᵣ by our method are examined.
Hasar et al. (Fri,) studied this question.