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Reliability assessment is mandatory to guarantee the correct behavior of Deep Neural Network (DNN) hardware accelerators in safety-critical applications. While fault injection stands out as a well-established, practical and robust method for reliability assessment, it is still a very time-consuming process. This paper contributes with three recipes for optimizing the efficiency of the reliability assessment: a) hybrid analytical and hierarchical FI-based reliability assessment for systolic-array-based DNN accelerators; b) mixing techniques for the reliability assessment of in-chip AI accelerators in GPUs; c) reliability assessment of DNN hardware accelerators through physical fault injection. The experimental results demonstrate the efficiency of the proposed methods applied to their target DNN HW accelerator platforms.
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Mohammad Hasan Ahmadilivani
Alberto Bosio
Bastien Deveautour
Centre National de la Recherche Scientifique
Université de Rennes
Polytechnic University of Turin
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Ahmadilivani et al. (Mon,) studied this question.
www.synapsesocial.com/papers/68e6e1dcb6db64358765d48f — DOI: https://doi.org/10.1109/vts60656.2024.10538707