Improved Printed Circuit Board Defect Detection Scheme

Abstract In this paper, an improved printed circuit board(PCB)defect detection scheme named PD-YOLOv8 is proposed, which is specialized in the common and challenging problem of small target recognition in PCB inspection. This improved scheme mainly relies on the basic framework of YOLOv8n, and effectively enhances the detection performance of PCB small defects through multiple innovative designs. First, we incorporate the E-CANet attention mechanism into the backbone network of YOLOv8, which improves the performance of small object detection by adaptively enhancing the expressiveness of key features, so that the network possesses higher sensitivity and focus on tiny details in PCB images. Second, we optimize and upgraded the neck structure. On the one hand, the C2f E module is introduced to facilitate cross-layer feature fusion to ensure that the rich texture information at the lower layer and the abstract semantic information at the higher layer complement each other, which is conducive to improving the contextual understanding of small object detection; on the other hand, a detection head specialized for small targets is designed and added to enhance the ability of locating and identifying tiny defects. Furthermore, in order to further enhance the interaction and fusion of multi-scale features, we also add a SlimNeck module to the neck structure, which realizes efficient information transfer through streamlined design and reduces computational complexity at the same time. In addition, we draw on the advanced BiFPN structure, which enables the bidirectional flow of feature information between multiple layers and greatly improves the capture and integration of small target features. Compared to the original YOLOv8 algorithm , this algorithm improves the average accuracy on small targets by 5.7% for mAP50 and 2.2% for mAP50-95.