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The inhomogeneous valence distribution due to in the intrinsic electric field of a material can weaken the interfacial H-bonding connectivity under the bias potential, which promotes the mass transfer of HMF during the HMF electrooxidation reaction.
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Zhaohui Yang
Lan Chen
Yijun Yin
Energy & Environmental Science
Renmin University of China
Beijing Forestry University
Henan Normal University
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Yang et al. (Mon,) studied this question.
www.synapsesocial.com/papers/69dabe9d4a1e15904c836115 — DOI: https://doi.org/10.1039/d4ee03482a