Chamfer distance for non-linear registration of Triply Periodic Minimal Surface lattices

We present a 3D image registration technique for non-linear deformation estimation in Additive Manufacturing processes. The methodology involves comparing X-ray Computed Tomography (XCT) data with Computer Aided Design (CAD) models for Triply Periodic Minimal Surface (TPMS) lattices and employs the Chamfer distance to refine mesh non-linear deformations. • We use Chamfer distance to solve a non-linear registration task on a TPMS mesh. • The Dice score goes from 87.27% to 97.10% and MSE from 7.24% to 1.95%. • Strain analysis shows volume shrinks mainly along the build direction in PBF-LB printing.