ABSTRACT Raman spectroscopy is a powerful tool for material characterization. However, careful preprocessing is required for the identification and handling of noise, baseline drift, and random spikes. This paper presents a comprehensive approach to generating and preprocessing Raman spectra. Additionally, we describe methods for fitting Voigt peaks to the spectrum to determine peak parameters. The effectiveness of these methods is demonstrated using both synthetic and real Raman spectra, with code provided in an open‐source GitHub repository.
Kizilov et al. (Tue,) studied this question.