Closing resistors in ultra-high-voltage (UHV) gas-insulated circuit breakers (GCBs) are critical components designed to suppress inrush currents and transient overvoltages during switching operations. However, in practical service, these resistors are subjected to repeated mechanical impacts and transient electrical stresses, leading to degradation of their electrical contact interfaces, fluctuating resistance values, and potential failure of the entire breaker assembly. Existing studies mostly simplify the closing resistor as a constant resistance element, neglecting the coupled electro-thermal–mechanical effects that occur during transient events. In this work, a comprehensive modeling framework is developed to investigate the dynamic electrical contact characteristics of a 750 kV GCB closing resistor under transient closing impacts. First, an electromagnetic transient model is built to calculate the combined inrush and power-frequency currents flowing through the resistor during its pre-insertion period. A full-scale mechanical test platform is then used to capture acceleration signals representing the mechanical shock imparted to the resistor stack. These measured signals are fed into a finite element model incorporating the Cooper–Mikic–Yovanovich (CMY) electrical contact correlation to simulate stress evolution, current density distribution, and temperature rise at the resistor interface. The simulation reveals pronounced skin effect and current crowding at resistor edges, leading to localized heating, while transient mechanical impacts cause contact pressure to fluctuate dynamically—resulting in a temporary decrease and subsequent recovery of contact resistance. These findings provide insight into the real-time behavior of closing resistors under operational conditions and offer a theoretical basis for design optimization and lifetime assessment of UHV GCBs.
Bao et al. (Thu,) studied this question.