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This is a Quantitative Study study.

October 2, 2025Open Access

Spin Squeezing in Electron Microscopy

SEShiran Even-HaimTechnion – Israel Institute of Technology ENEthan NussinsonTechnion – Israel Institute of Technology RBRoni Ben-MaimonWeizmann Institute of Science

Key Points

Spin squeezing can enhance the signal-to-noise ratio in electron microscopy by leveraging quantum metrology principles.
Entangled states necessary for spin squeezing can be generated using electron-electron Coulomb interactions.
This approach potentially allows electron microscopy to surpass the traditional shot noise limit in imaging.
The findings link quantum metrology and electron interferometry, fostering advances in high-resolution biological imaging.

Abstract

Quantum metrology experiments in atomic physics and quantum optics have demonstrated measurement accuracy beyond the shot-noise limit via multi-particle entanglement. At the same time, electron microscopy, an essential tool for high-resolution imaging of biological systems, is severely constrained in its signal-to-noise ratio (SNR) by shot noise, due to the dose limit imposed by electron beam-induced damage. Here, we show theoretically that spin squeezing, a form of quantum metrology based on entanglement, is a natural fit for improving the SNR in electron microscopy. We investigate the generation of the necessary entangled states through electron-electron Coulomb interactions and quantum non-demolition measurements. Our results connect the fields of quantum metrology and electron interferometry, paving the way toward electron microscopy with SNR beyond the shot-noise limit.

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