Programmable electron-beam scanning offers new opportunities to improve dose efficiency and suppress scan-induced artifacts in scanning transmission electron microscopy. Here, we systematically benchmark the impact of non-raster trajectories, including spiral and multi-pass sequential patterns, on two dose sensitive techniques: electron energy-loss spectroscopy (EELS) and ptychography. Using DyScO3 as a model perovskite, we compare spatial resolution, spectral fidelity, and artifact suppression across scan modes. Ptychographic phase reconstructions consistently achieve atomic resolution and remain robust to large jumps in probe position. In contrast, atomic-resolution EELS maps show pronounced sensitivity to probe motion, with sequential and spiral scans introducing non-uniform elemental contrast. Finally, spiral scanning applied under cryogenic conditions in BaTiO3 thin films improves dose uniformity and mitigates drift related distortions. These results establish practical guidelines for the implementation of programmable scan strategies in low-dose 4D-STEM and highlight the inherent resilience of ptychography to trajectory-induced artifacts.
Palos et al. (Fri,) studied this question.